X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

datePublished

• 1988

description

• kuvitettu
• Väitöskirjan tiivistelmäosa

identifier

• propertyID: FI-FENNI value: 255862
• propertyID: FI-MELINDA value: 000712221
• propertyID: skl value: fx255862

isbn

• 9516662641

isPartOf

• Acta polytechnica Scandinavica, Mechanical engineering series
• Fennica

name

• X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

numberOfPages

• 46 s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Helsinki organizer: Teknillisten tieteiden akatemia

publisher

• Teknillisten tieteiden akatemia