Oikkonen, Markku

name

• Oikkonen, Markku

Authored works

• X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy

Works contributed to

• Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation

Works about Oikkonen, Markku