Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation

Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation

datePublished

• 1982

description

• kuvitettu
• Submitted for publ. in a periodical.

identifier

• propertyID: FI-FENNI value: 8708
• propertyID: FI-MELINDA value: 000620888
• propertyID: skl value: f830691

isPartOf

• Fennica
• Report / Helsinki University of Technology. Institution of Process Metallurgy. [Department of Mining and Metallurgy]. B

name

• Comparative study of crystal phase, crystallite size and microstrain in the electroluminescent ZnS:Mn films grown by atomic layer epitaxy and electron beam evaporation

numberOfPages

• [3], 20 s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Hki organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu