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Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00040658600
author
Mattila, Toni
contributor
Teknillinen korkeakoulu. Elektroniikan valmistustekniikan laboratorio
inLanguage
en
isPartOf
Fennica
name
Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
-
2005 : Teknillinen korkeakoulu
Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00040658601
description
Julkaistu myös verkkoaineistona
isPartOf
Fennica
Helsinki University of Technology, Department of Electrical and Communications Engineering, Laboratory of Electronics Production Technology
name
Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
View this in Finna
Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00040658600
datePublished
2005
description
kuvitettu
Tiivistelmä ja 5 erip.
identifier
propertyID:
FI-FENNI
value:
826999
propertyID:
FI-MELINDA
value:
000406586
propertyID:
skl
value:
fx826999
isbn
9512279835
9512279843
isPartOf
Fennica
Helsinki University of Technology, Department of Electrical and Communications Engineering, Laboratory of Electronics Production Technology
name
Reliability of high-density lead-free solder interconnections under thermal cycling and mechanical shock loading
numberOfPages
56, [146] sivu
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Espoo
organizer:
Teknillinen korkeakoulu
publisher
Teknillinen korkeakoulu
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