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Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00686256100
author
Dahlberg, Krista
contributor
Aalto-yliopiston sähkötekniikan korkeakoulu. Radiotieteen ja -tekniikan laitos
inLanguage
en
isPartOf
Fennica
name
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
-
-
-, e-book
2014 : Aalto University, School of Electrical Engineering, Department of Radio Science and Engineering
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00686256101
description
Yhteenveto-osa julkaistu myös verkkoaineistona
isPartOf
Fennica
Publication / Tampere University of Technology, Department of Civil Engineering, Structural Engineering
name
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00686256102
isbn
9789526058313
isPartOf
Fennica
Publication / Tampere University of Technology, Department of Civil Engineering, Structural Engineering
name
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00686256103
bookFormat
<http://schema.org/EBook>
isPartOf
Fennica
Publication / Tampere University of Technology, Department of Civil Engineering, Structural Engineering
name
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
url
<http://urn.fi/URN:ISBN:978-952-60-5831-3>
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00686256100
datePublished
2014
description
Artikkeliväitöskirjan yhteenveto-osa ja 7 eripainosta.
kuvitettu
identifier
propertyID:
FI-MELINDA
value:
006862561
isbn
9789526058306
isPartOf
Fennica
Publication / Tampere University of Technology, Department of Civil Engineering, Structural Engineering
name
Development of on-wafer calibration methods and planar Schottky diode characterisation at THz frequencies
numberOfPages
116, [58] sivu
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Espoo
organizer:
Aalto University, School of Electrical Engineering, Department of Radio Science and Engineering
publisher
Aalto University, School of Electrical Engineering, Department of Radio Science and Engineering
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