Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

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  • en
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  • Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies
P60049

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Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

isbn
  • 9789526057767
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  • Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

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  • Yhteenveto-osa julkaistu myös verkkoaineistona
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  • Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

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  • Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies
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Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies

datePublished
  • 2014
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 5 eripainosta.
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  • propertyID: FI-MELINDA value: 006834212
isbn
  • 9789526057750
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name
  • Effects of accelerated lifetime test parameters and failure mechanisms on the reliability of electronic assemblies
numberOfPages
  • 67, [88] sivu
P60048
P60050
publication
  • location: Espoo organizer: Aalto University, School of Electrical Engineering, Department of Electrical Engineering and Automation, Unit of Electronics Integration and Reliability
publisher
  • Aalto University, School of Electrical Engineering, Department of Electrical Engineering and Automation, Unit of Electronics Integration and Reliability

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