Sequential detection applied to line-scan gray level defect imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:W00557833600
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  • en
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  • Sequential detection applied to line-scan gray level defect imaging
P60049

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Sequential detection applied to line-scan gray level defect imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:I00557833601
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  • Sequential detection applied to line-scan gray level defect imaging
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Sequential detection applied to line-scan gray level defect imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:I00557833600
datePublished
  • 2009
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 5 eripainosta.
  • kuvitettu
identifier
  • propertyID: FI-FENNI value: 926891
  • propertyID: FI-MELINDA value: 005578336
  • propertyID: skl value: fx926891
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  • 9789521522062
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  • Sequential detection applied to line-scan gray level defect imaging
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  • xii, 64, [40] s.
P60048
P60050
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  • location: Tampere organizer: Tampereen teknillinen korkeakoulu Tampereen teknillinen yliopisto. Optoelektroniikan tutkimuskeskus
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