Development of instrumentation and methods for positron spectroscopy of defects in semiconductors

Development of instrumentation and methods for positron spectroscopy of defects in semiconductors

datePublished

• 2001

description

• kuvitettu
• Tiivistelmä ja 6 erip.

identifier

• propertyID: FI-FENNI value: 695921
• propertyID: FI-MELINDA value: 005515934
• propertyID: skl value: fx695921

isbn

• 9512254670

isPartOf

• Dissertations / Laboratory of Physics, Helsinki University of Technology
• Fennica

name

• Development of instrumentation and methods for positron spectroscopy of defects in semiconductors

numberOfPages

• iv, 31, [57] sivu

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu