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Defect localization on a PCB with functional testing
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00334395700
author
Gebus, Sébastien
contributor
Juuso, Esko
Lorillard, Sébastien
inLanguage
en
isPartOf
Fennica
name
Defect localization on a PCB with functional testing
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
2002 : Oulun yliopisto
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Defect localization on a PCB with functional testing
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00334395700
datePublished
2002
description
kuvitettu
identifier
propertyID:
FI-FENNI
value:
715857
propertyID:
FI-MELINDA
value:
003343957
propertyID:
skl
value:
fx715857
isbn
9514267311
isPartOf
Fennica
Report
name
Defect localization on a PCB with functional testing
numberOfPages
44, [2] sivu
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Oulu
organizer:
Oulun yliopisto
publisher
Oulun yliopisto
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