Development of X-ray topographic techniques and their application to the characterization of the crystalline imperfections in trigonal selenium, tellurium and mercury sulfide single crystals

Development of X-ray topographic techniques and their application to the characterization of the crystalline imperfections in trigonal selenium, tellurium and mercury sulfide single crystals

datePublished

• 1976

description

• kuvitettu
• Tiivistelmä ja 5 erip.

identifier

• propertyID: FI-FENNI value: 127972
• propertyID: FI-MELINDA value: 003177859
• propertyID: skl value: fx127972

isbn

• 9519492704

isPartOf

• Fennica

name

• Development of X-ray topographic techniques and their application to the characterization of the crystalline imperfections in trigonal selenium, tellurium and mercury sulfide single crystals

numberOfPages

• 17, [41] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Hki organizer: K. Naukkarinen

publisher

• K. Naukkarinen