Quantitative x-ray microanalysis based on the depth distribution function of x-ray generation

Quantitative x-ray microanalysis based on the depth distribution function of x-ray generation

datePublished

• 1990

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 193005
• propertyID: FI-MELINDA value: 003120837
• propertyID: skl value: fx193005

isbn

• 9518805180

isPartOf

• Fennica
• Turun yliopisto. Fysikaalisten tieteiden laitos. Report series. L

name

• Quantitative x-ray microanalysis based on the depth distribution function of x-ray generation

numberOfPages

• 12, [10] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Turku organizer: Turun yliopisto

publisher

• Turun yliopisto