Quantitative elemental analysis of thick solid samples using the PIXE technique and a millimetre-sized proton beam

Quantitative elemental analysis of thick solid samples using the PIXE technique and a millimetre-sized proton beam

datePublished

• 2008

description

• Artikkeliväitöskirjan yhteenveto-osa ja 4 eripainosta.
• kuvitettu
• Sammanfattning + 4 artiklar

identifier

• propertyID: FI-FENNI value: 906647
• propertyID: FI-MELINDA value: 000546735
• propertyID: skl value: fx906647

isbn

• 9789521221705

isPartOf

• Fennica

name

• Quantitative elemental analysis of thick solid samples using the PIXE technique and a millimetre-sized proton beam

numberOfPages

• 42, [24] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Åbo organizer: Åbo Akademi University, Department of Physics

publisher

• Åbo Akademi University, Department of Physics