Defect and yield analysis of semiconductor components and integrated circuits

URI: http://urn.fi/URN:NBN:fi:bib:me:W00026869800
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  • en
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  • Defect and yield analysis of semiconductor components and integrated circuits
P60049

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Defect and yield analysis of semiconductor components and integrated circuits

URI: http://urn.fi/URN:NBN:fi:bib:me:I00026869801
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  • Julkaistu myös verkkoaineistona
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  • Defect and yield analysis of semiconductor components and integrated circuits
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Defect and yield analysis of semiconductor components and integrated circuits

URI: http://urn.fi/URN:NBN:fi:bib:me:I00026869800
datePublished
  • 2003
description
  • kuvitettu
  • Tiivistelmä ja 6 erip. - Nimiösivulla myös: Helsinki University of Technology, Department of Electrical and Communication Engineering, Optoelectronics laboratory
identifier
  • propertyID: FI-FENNI value: 728772
  • propertyID: FI-MELINDA value: 000268698
  • propertyID: skl value: fx728772
isbn
  • 9512263688
  • 951226370X
isPartOf
name
  • Defect and yield analysis of semiconductor components and integrated circuits
numberOfPages
  • xii, 67, [43] sivu
P60048
P60050
publication
  • location: Espoo organizer: Teknillinen korkeakoulu
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