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Non-destructive inspection processes in electronics
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00023452700
contributor
Leppävuori, S
inLanguage
en
isPartOf
Fennica
name
Non-destructive inspection processes in electronics
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
2001 : Oulun yliopisto
View this in Finna
Non-destructive inspection processes in electronics
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00023452700
datePublished
2001
description
kuvitettu
identifier
propertyID:
FI-FENNI
value:
683155
propertyID:
FI-MELINDA
value:
000234527
propertyID:
skl
value:
fx683155
isbn
9514258878
isPartOf
Fennica
Oulun yliopisto. Sähköinsinööriosasto. Raportti. T
name
Non-destructive inspection processes in electronics
numberOfPages
43 s.
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Oulu
organizer:
Oulun yliopisto
publisher
Oulun yliopisto
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