Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:W00016497100
author
contributor
inLanguage
  • en
isPartOf
name
  • Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors
P60049

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Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00016497100
datePublished
  • 1997
description
  • kuvitettu
  • Tiivistelmä ja 6 erip. - Tiivistelmä erillisenä
  • Väitöskirjan tiivistelmäosa
identifier
  • propertyID: FI-FENNI value: 596689
  • propertyID: FI-MELINDA value: 000164971
  • propertyID: skl value: fx596689
isbn
  • 951223761X
isPartOf
name
  • Identification of point defect structures in semiconductors by positron annihilation : application to silicon and compound semiconductors
numberOfPages
  • 52 s.
P60048
P60050
publication
  • location: Espoo organizer: Teknillinen korkeakoulu
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