Mathematical models, accuracy aspects and quality control : supplement to the proceedings of the symposium, June 7-11, 1982, Helsinki University of Technology, Otaniemi, Finland

contributor

• Hakkarainen, Juhani
• International Society for Photogrammetry and Remote Sensing. Commission 3
• Kilpelä, Einari
• Savolainen, Aino
• Teknillinen korkeakoulu

inLanguage

• de
• en

isPartOf

• Fennica

name

• Mathematical models, accuracy aspects and quality control : proceedings of the Symposium, June 7-11, 1982, Helsinki University of Technology, Otaniemi, Finland
• Mathematical models, accuracy aspects and quality control : supplement to the proceedings of the symposium, June 7-11, 1982, Helsinki University of Technology, Otaniemi, Finland

P60049

• <http://rdaregistry.info/termList/RDAContentType/1020>

Instances

• 1982 : Teknillinen korkeakoulu
• 1982 : Teknillinen korkeakoulu