{
  "@context": {
    "@vocab": "http://schema.org/",
    "rdau": "http://rdaregistry.info/Elements/u/",
    "skos": "http://www.w3.org/2004/02/skos/core#",
    "skos:prefLabel": {
      "@container": "@language"
    }
  },
  "@graph": [
    {
      "@id": "http://urn.fi/URN:NBN:fi:bib:me:P00911861501",
      "@type": "Person",
      "name": "Mekkanen, Mike"
    },
    {
      "@id": "http://urn.fi/URN:NBN:fi:bib:me:W00911861500",
      "author": {
        "@id": "http://urn.fi/URN:NBN:fi:bib:me:P00911861501"
      },
      "name": "On reliability and performance analyses of IEC 61850 for digital SAS"
    }
  ]
}