Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01000061802

isbn

9789512967117

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01118601001

isbn

9789512967100

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01000061801

description

Yhteenveto-osa julkaistu myös verkkoaineistona

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01000061803

bookFormat

<http://schema.org/EBook>

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

url

<http://urn.fi/URN:ISBN:978-951-29-6711-7>

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01000061800

datePublished

2017

description

Artikkeliväitöskirjan yhteenveto-osa ja 5 eripainosta.
kuvitettu

isbn

9789512967100

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

numberOfPages

vii, 59 sivua, 27 numeroimatonta sivua

P60048

P60050

<http://rdaregistry.info/termList/RDAMediaType/1007>

publication

location: Turku organizer: Turun yliopisto

publisher

Turun yliopisto

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

URI: http://urn.fi/URN:NBN:fi:bib:me:I01118601000

bookFormat

<http://schema.org/EBook>

datePublished

2017

description

Artikkeliväitöskirjan yhteenveto-osa, 27.6.2018.
kuvitettu

identifier

propertyID: FI-MELINDA value: 011186010

isbn

9789512967117

isPartOf

name

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

numberOfPages

1 verkkoaineisto (vii, 59 sivua)

P60048

<http://rdaregistry.info/termList/RDACarrierType/1018>

P60050

<http://rdaregistry.info/termList/RDAMediaType/1003>

publication

location: Turku organizer: Turun yliopisto

publisher

Turun yliopisto

url

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Instances

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals

Atomic scale engineering and understanding of novel interfaces between oxide films and semiconductor crystals