New algorithms for network analyzer, test fixture and wafer prober calibration

author
inLanguage
  • en
isPartOf
name
  • New algorithms for network analyzer, test fixture and wafer prober calibration
P60049

Instances

New algorithms for network analyzer, test fixture and wafer prober calibration

datePublished
  • 1999
description
  • kuvitettu
  • Tiivistelmä ja 4 eripainosta.
identifier
  • propertyID: FI-FENNI value: 638414
  • propertyID: FI-MELINDA value: 003888645
  • propertyID: skl value: fx638414
isbn
  • 9525148947
isPartOf
name
  • New algorithms for network analyzer, test fixture and wafer prober calibration
numberOfPages
  • 60 sivua, 24 sivua useina sivunumerointijaksoina
P60048
P60050
publication
  • location: Espoo organizer: Teknillisten tieteiden akatemia
publisher

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