Fundamental parameter method in x-ray fluorescence analysis as candidate for usage in electron microscopy

Fundamental parameter method in x-ray fluorescence analysis as candidate for usage in electron microscopy

datePublished

• 1991

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 222450
• propertyID: FI-MELINDA value: 003140918
• propertyID: skl value: fx222450

isbn

• 9518806462

isPartOf

• Fennica
• Rep. ser. - Dep. Appl. Phys., Univ. Turku, D

name

• Fundamental parameter method in x-ray fluorescence analysis as candidate for usage in electron microscopy

numberOfPages

• 9, [2] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Turku organizer: Turun yliopisto

publisher

• Turun yliopisto