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Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00075173400
author
Johansson, Leena-Sisko
inLanguage
en
isPartOf
Fennica
name
Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
1993 : Teknillisten tieteiden akatemia
View this in Finna
Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00075173400
datePublished
1993
description
kuvitettu
Tiivistelmä ja 6 erip. - Tiivistelmä ilm. myös erillisenä. - Nimiösivulla myös: University of Turku, Department of Applied Physics/Materials Science
identifier
propertyID:
FI-FENNI
value:
338611
propertyID:
FI-MELINDA
value:
000751734
propertyID:
skl
value:
fx338611
isbn
9516663907
isPartOf
Acta polytechnica Scandinavica. Ch, Chemistry including metallurgy series
Fennica
name
Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
numberOfPages
32, [43] s.
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Helsinki
organizer:
Teknillisten tieteiden akatemia
publisher
Teknillisten tieteiden akatemia
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