Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials

author
inLanguage
  • en
isPartOf
name
  • Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
P60049

Instances

Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials

datePublished
  • 1993
description
  • kuvitettu
  • Tiivistelmä ja 6 erip. - Tiivistelmä ilm. myös erillisenä. - Nimiösivulla myös: University of Turku, Department of Applied Physics/Materials Science
identifier
  • propertyID: FI-FENNI value: 338611
  • propertyID: FI-MELINDA value: 000751734
  • propertyID: skl value: fx338611
isbn
  • 9516663907
isPartOf
name
  • Characterization of overlayers in nanometric scale : case studies of TiO[sub 2] materials
numberOfPages
  • 32, [43] s.
P60048
P60050
publication
  • location: Helsinki organizer: Teknillisten tieteiden akatemia
publisher

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