Characterization of deep levels in P-type silicon by DLTS

Characterization of deep levels in P-type silicon by DLTS

datePublished

• 1997

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 555713
• propertyID: FI-MELINDA value: 000160972
• propertyID: skl value: fx555713

isbn

• 9512233924

isPartOf

• Fennica
• Report / Helsinki University of Technology, Faculty of Electrical Engineering, Radio Laboratory. S

name

• Characterization of deep levels in P-type silicon by DLTS

numberOfPages

• 27, [2] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu