Thick sample analysis with PIXE

Thick sample analysis with PIXE

datePublished

• 1982

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 70573
• propertyID: FI-MELINDA value: 000086022
• propertyID: skl value: fx70573

isbn

• 951452845X

isPartOf

• Fennica
• Report series in physics / University of Helsinki, Department of Physics. A

name

• Thick sample analysis with PIXE

numberOfPages

• [3], 24 s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Hki organizer: Helsingin yliopisto. Fysiikan laitos

publisher

• Helsingin yliopisto. Fysiikan laitos