Modeling and measurement methods for high speed bipolar transistors

Modeling and measurement methods for high speed bipolar transistors

datePublished

• 1989

description

• kuvitettu
• Tiivistelmä ja 5 erip.

identifier

• propertyID: FI-FENNI value: 104365
• propertyID: FI-MELINDA value: 000043905
• propertyID: skl value: fx104365

isbn

• 9517548818

isPartOf

• Fennica
• Report / Teknillinen korkeakoulu. Vuoriteollisuusosasto. Prosessimetallurgia. B

name

• Modeling and measurement methods for high speed bipolar transistors

numberOfPages

• [102] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu