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Search works, persons, organizations and subjects:
Duan, Guoyong
URI:
http://urn.fi/URN:NBN:fi:au:pn:000151847
name
Duan, Guoyong
Authored works
Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors
Works contributed to
Works about Duan, Guoyong
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