Root cause analysis and applications for fast high-resolution imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:W01522687200

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author

Inglese, Alessandro

contributor

Aalto-yliopiston sähkötekniikan korkeakoulu. Elektroniikan ja nanotekniikan laitos

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Fennica

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On the light-activation of copper impurities in crystalline silicon :
On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging
Root cause analysis and applications for fast high-resolution imaging

P60049

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:I01522687201

description

Yhteenveto-osa julkaistu myös verkkoaineistona

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name

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

On the light-activation of copper impurities in crystalline silicon :

URI: http://urn.fi/URN:NBN:fi:bib:me:I01522687202

isbn

9789526080420

isPartOf

name

On the light-activation of copper impurities in crystalline silicon :

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:I01522687203

bookFormat

<http://schema.org/EBook>

isPartOf

name

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

url

<http://urn.fi/URN:ISBN:978-952-60-8042-0>

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

URI: http://urn.fi/URN:NBN:fi:bib:me:I01522687200

datePublished

2018

description

Artikkeliväitöskirjan yhteenveto-osa ja viisi eripainosta.
kuvitettu

isbn

9789526080413

isPartOf

name

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging
Root cause analysis and applications for fast high-resolution imaging

numberOfPages

xviii, 83 sivua, 39 sivua useina numerointijaksoina

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<http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

<http://rdaregistry.info/termList/RDAMediaType/1007>

publication

location: Helsinki organizer: Aalto University, School of Electrical Engineering, Department of Electronics and Nanoengineering, Electron Physics Group

publisher

Aalto University, School of Electrical Engineering, Department of Electronics and Nanoengineering, Electron Physics Group

Root cause analysis and applications for fast high-resolution imaging

Instances

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

On the light-activation of copper impurities in crystalline silicon :

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging

On the light-activation of copper impurities in crystalline silicon : root cause analysis and applications for fast high-resolution imaging