Synchrotron radiation x-ray topography of crystallographic defects in GaN

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contributor
inLanguage
  • en
isPartOf
name
  • Synchrotron radiation x-ray topography of crystallographic defects in GaN
P60049

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Synchrotron radiation x-ray topography of crystallographic defects in GaN

description
  • Yhteenveto-osa julkaistu myös verkkoaineistona
isPartOf
name
  • Synchrotron radiation x-ray topography of crystallographic defects in GaN

Synchrotron radiation x-ray topography of crystallographic defects in GaN

isbn
  • 9789526059709
isPartOf
name
  • Synchrotron radiation x-ray topography of crystallographic defects in GaN

Synchrotron radiation x-ray topography of crystallographic defects in GaN

bookFormat
isPartOf
name
  • Synchrotron radiation x-ray topography of crystallographic defects in GaN
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Synchrotron radiation x-ray topography of crystallographic defects in GaN

datePublished
  • 2014
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 6 eripainosta.
  • kuvitettu
identifier
  • propertyID: FI-MELINDA value: 007010682
isbn
  • 9789526059693
isPartOf
name
  • Synchrotron radiation x-ray topography of crystallographic defects in GaN
numberOfPages
  • 76, [46] sivu
P60048
P60050
publication
  • location: Helsinki organizer: Aalto University, School of Electrical Engineering, Department of Micro- and nanosciences, Nanotechnology
publisher
  • Aalto University, School of Electrical Engineering, Department of Micro- and nanosciences, Nanotechnology

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