Linear and traceable scales for nanometrology

URI: http://urn.fi/URN:NBN:fi:bib:me:W00700695400
author
contributor
inLanguage
  • en
isPartOf
name
  • Linear and traceable scales for nanometrology
P60049

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Linear and traceable scales for nanometrology

URI: http://urn.fi/URN:NBN:fi:bib:me:I00700695401
description
  • Yhteenveto-osa julkaistu myös verkkoaineistona
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  • Linear and traceable scales for nanometrology

Linear and traceable scales for nanometrology

URI: http://urn.fi/URN:NBN:fi:bib:me:I00700695402
isbn
  • 9789526059433
isPartOf
name
  • Linear and traceable scales for nanometrology

Linear and traceable scales for nanometrology

URI: http://urn.fi/URN:NBN:fi:bib:me:I00700695403
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isPartOf
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  • Linear and traceable scales for nanometrology
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Linear and traceable scales for nanometrology

URI: http://urn.fi/URN:NBN:fi:bib:me:I00700695400
datePublished
  • 2014
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 6 eripainosta.
  • kuvitettu
  • Tekijän nimi kannessa: S. Jeremias Seppä.
identifier
  • propertyID: FI-MELINDA value: 007006954
isbn
  • 9789526059426
isPartOf
name
  • Linear and traceable scales for nanometrology
numberOfPages
  • xii, 82, [64] sivu
P60048
P60050
publication
  • location: Helsinki organizer: Aalto University, School of Electrical Engineering, Signal Processing and Acoustics, Metrology
publisher
  • Aalto University, School of Electrical Engineering, Signal Processing and Acoustics, Metrology

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