Traceability for nanometre scale measurements :

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  • Atomic force microscopes in dimensional nanometrology
  • Traceability for nanometre scale measurements :
  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
P60049

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Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology

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  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology

Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology

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  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology

Traceability for nanometre scale measurements :

isbn
  • 9789526682204
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  • Traceability for nanometre scale measurements :

Traceability for nanometre scale measurements :

isbn
  • 9789526682211
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  • Traceability for nanometre scale measurements :

Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology

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  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
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Atomic force microscopes in dimensional nanometrology

datePublished
  • 2014
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 5 eripainosta.
  • kuvitettu
identifier
  • propertyID: FI-MELINDA value: 006999975
isbn
  • 9789526682204
isPartOf
name
  • Atomic force microscopes in dimensional nanometrology
  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
numberOfPages
  • 61, [44] sivu
P60048
P60050
publication
  • location: Espoo organizer: Mittatekniikan keskus
publisher

Atomic force microscopes in dimensional nanometrology

bookFormat
datePublished
  • 2014
description
  • Artikkeliväitöskirjan yhteenveto-osa.
  • Nimeke nimiösivulta.
identifier
  • propertyID: FI-MELINDA value: 007319983
isbn
  • 9789526682211
isPartOf
name
  • Atomic force microscopes in dimensional nanometrology
  • Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
numberOfPages
  • 1 verkkoaineisto (61 s.)
P60048
P60050
publication
  • location: Espoo organizer: Mittatekniikan keskus
publisher
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