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Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00091813500
about
Japani
kansainvälinen vertailu
Korea
lainsäädäntö
patentit
patentointi
teknologinen kehitys
yhdenmukaistaminen
Yhdysvallat
author
Lee, Na Ri
inLanguage
en
isPartOf
Fennica
name
Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
2000 : Vaasan korkeakoulu
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Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00091813500
datePublished
2000
description
kuvitettu
Oikeustiede-sarjan alasarja: Business Law.
identifier
propertyID:
FI-FENNI
value:
663402
propertyID:
FI-MELINDA
value:
000918135
propertyID:
skl
value:
fx663402
isbn
9516838596
isPartOf
Fennica
Julkaisu / Lappeenrannan teknillinen korkeakoulu. Kemiantekniikan osasto
name
Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
numberOfPages
235, [1] s.
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Vaasa
organizer:
Vaasan korkeakoulu Vaasan yliopisto
publisher
Vaasan korkeakoulu
Vaasan yliopisto
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