Electronic structure calculations for vacancies and oxygen-related defects in semiconductors

Electronic structure calculations for vacancies and oxygen-related defects in semiconductors

datePublished

• 2000

description

• kuvitettu
• Tiivistelmä ja 6 erip.

identifier

• propertyID: FI-FENNI value: 670554
• propertyID: FI-MELINDA value: 000224563
• propertyID: skl value: 951-22-5051-9
• propertyID: skl value: fx670554

isbn

• 9512250519

isPartOf

• Dissertations / Laboratory of Physics, Helsinki University of Technology
• Fennica

name

• Electronic structure calculations for vacancies and oxygen-related defects in semiconductors

numberOfPages

• iv, 34, [41] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu