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Traceability for nanometre scale measurements :
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00699997500
about
aallonpituus
kalibrointi
laserit
metrologia
mittaus
pituudenmittaus
author
Korpelainen, Virpi
inLanguage
en
isPartOf
Fennica
name
Atomic force microscopes in dimensional nanometrology
Traceability for nanometre scale measurements :
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
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-, e-book
2014 : Mittatekniikan keskus
2014 : Mittatekniikan keskus, e-book
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00699997501
description
Yhteenveto-osa julkaistu myös verkkoaineistona
isPartOf
Fennica
Publication / MIKES. J
name
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
Traceability for nanometre scale measurements :
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00731998302
isbn
9789526682204
isPartOf
Fennica
Publication / MIKES. J
name
Traceability for nanometre scale measurements :
Traceability for nanometre scale measurements :
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00699997502
isbn
9789526682211
isPartOf
Fennica
Publication / MIKES. J
name
Traceability for nanometre scale measurements :
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00731998301
description
Julkaistu myös painettuna
isPartOf
Fennica
Publication / MIKES. J
name
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00699997503
bookFormat
<http://schema.org/EBook>
isPartOf
Fennica
Publication / MIKES. J
name
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
url
<http://urn.fi/URN:ISBN:978-952-6682-21-1>
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00699997500
datePublished
2014
description
Artikkeliväitöskirjan yhteenveto-osa ja 5 eripainosta.
kuvitettu
identifier
propertyID:
FI-MELINDA
value:
006999975
isbn
9789526682204
isPartOf
Fennica
Publication / MIKES. J
name
Atomic force microscopes in dimensional nanometrology
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
numberOfPages
61, [44] sivu
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Espoo
organizer:
Mittatekniikan keskus
publisher
Mittatekniikan keskus
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00731998300
bookFormat
<http://schema.org/EBook>
datePublished
2014
description
Artikkeliväitöskirjan yhteenveto-osa.
Nimeke nimiösivulta.
identifier
propertyID:
FI-MELINDA
value:
007319983
isbn
9789526682211
isPartOf
Fennica
Publication / MIKES. J
name
Atomic force microscopes in dimensional nanometrology
Traceability for nanometre scale measurements : atomic force microscopes in dimensional nanometrology
numberOfPages
1 verkkoaineisto (61 s.)
P60048
<http://rdaregistry.info/termList/RDACarrierType/1018>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1003>
publication
location:
Espoo
organizer:
Mittatekniikan keskus
publisher
Mittatekniikan keskus
url
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