Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors

URI: http://urn.fi/URN:NBN:fi:bib:me:W00614726600
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  • Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors
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Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00614726601
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  • Yhteenveto-osa julkaistu myös verkkoaineistona ISBN 978-952-62-0085-9 (PDF)
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  • Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors

Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00614726602
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  • Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors
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Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00614726600
datePublished
  • 2013
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 7 eripainosta.
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  • propertyID: FI-FENNI value: 1028176
  • propertyID: FI-MELINDA value: 006147266
  • propertyID: skl value: fx1028176
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  • 9789526200842
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  • Three-dimensional effects and surface breakdown addressing efficiency and reliability problems in avalanche bipolar junction transistors
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  • 68, [50] sivu
P60048
P60050
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  • location: Oulu organizer: Oulun yliopisto
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