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Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00576975300
author
Miche, Yoan
contributor
Aalto-yliopiston teknillinen korkeakoulu. Tietojenkäsittelytieteen laitos
Bas, Patrick
Lendasse, Amaury
inLanguage
en
isPartOf
Fennica
name
Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
-
2010 : Aalto-yliopiston teknillinen korkeakoulu
Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00576975301
description
Myös verkkoaineistona ISBN 978-952-60-3250-4 (PDF)
isPartOf
Fennica
TKK Reports in Information and Computer Science
name
Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
View this in Finna
Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00576975300
datePublished
2010
description
kuvitettu
identifier
propertyID:
FI-FENNI
value:
953923
propertyID:
FI-MELINDA
value:
005769753
propertyID:
skl
value:
fx953923
isbn
9789526032498
isPartOf
Fennica
TKK Reports in Information and Computer Science
name
Using multiple re-embeddings for quantitative steganalysis and image reliability estimation
numberOfPages
19 sivua
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Espoo
organizer:
Aalto-yliopiston teknillinen korkeakoulu
publisher
Aalto-yliopiston teknillinen korkeakoulu
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