Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals

Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals

datePublished

• 1981

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 4857
• propertyID: FI-MELINDA value: 003939568
• propertyID: skl value: f811489

isPartOf

• Fennica
• Rapport : A / Tekniska högskolan i Helsingfors, laboratoriet för informationsbehandling

name

• Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals

numberOfPages

• [2], 8, [2] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu