Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction

Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction

datePublished

• 1981

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 6887
• propertyID: FI-MELINDA value: 003835200
• propertyID: skl value: f821745

isPartOf

• Fennica
• Report / Teknillinen korkeakoulu. Prosessi- ja materiaalitekniikan osasto. Materiaali- ja kalliotekniikan laitos. C

name

• Explanation of contrast effects in synchrotron x-ray topographs of bent crystals by means of multiple diffraction

numberOfPages

• [3], 11, [13] s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu. Fysiikan laboratorio

publisher

• Teknillinen korkeakoulu. Fysiikan laboratorio