Near-surface defect profiling with slow positrons

Near-surface defect profiling with slow positrons

datePublished

• 1985

description

• kuvitettu

identifier

• propertyID: FI-FENNI value: 17349
• propertyID: FI-MELINDA value: 003834397
• propertyID: skl value: f852849

isPartOf

• Fennica
• Helsingin teknillinen korkeakoulu. Fysiikan laboratorio. Report
• Report / Helsinki University of Technology, Laboratories of industrial economics and industrial psychology

name

• Near-surface defect profiling with slow positrons

numberOfPages

• [2], 16 s.

P60048

• <http://rdaregistry.info/termList/RDACarrierType/1049>

P60050

• <http://rdaregistry.info/termList/RDAMediaType/1007>

publication

• location: Espoo organizer: Teknillinen korkeakoulu

publisher

• Teknillinen korkeakoulu