Modeling of high-dose radiation damage in semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:W00274840900
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  • en
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  • Modeling of high-dose radiation damage in semiconductors
P60049

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Modeling of high-dose radiation damage in semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00657115201
description
  • Myös painettuna (ISBN 952-10-0937-3)
isPartOf
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  • Modeling of high-dose radiation damage in semiconductors

Modeling of high-dose radiation damage in semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00274840901
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  • Julkaistu myös verkkoaineistona
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  • Modeling of high-dose radiation damage in semiconductors
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Modeling of high-dose radiation damage in semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00274840900
datePublished
  • 2003
description
  • Artikkeliväitöskirjan yhteenveto-osa ja 6 eripainosta.
  • kuvitettu
  • Nimiösivulla myös: Accelerator Laboratory, Department of Physical Sciences, Faculty of Science, University of Helsinki, Helsinki, Finland.
  • Tiivistelmä ja 6 erip. - Nimiösivulla myös: Accelerator Laboratory, Department of Physical Sciences, Faculty of Science, University of Helsinki, Helsinki, Finland
identifier
  • propertyID: FI-FENNI value: 745843
  • propertyID: FI-MELINDA value: 002748409
  • propertyID: skl value: fx745843
isbn
  • 9521009373
  • 9521009381
isPartOf
name
  • Modeling of high-dose radiation damage in semiconductors
numberOfPages
  • 38, [72] sivu
P60048
P60050
publication
  • location: Helsinki organizer: Helsingin yliopisto
publisher
View this in Finna

Modeling of high-dose radiation damage in semiconductors

URI: http://urn.fi/URN:NBN:fi:bib:me:I00657115200
bookFormat
datePublished
  • 2003
description
  • Kuvailun perusta: Nimeke nimiönäytöstä.
  • Tekstiä
  • Tiivistelmäosa. - Nimiönäytöllä myös: Accelerator Laboratory, Department of Physical Sciences, Faculty of Science, University of Helsinki
identifier
  • propertyID: FI-FENNI value: 742458
  • propertyID: FI-MELINDA value: 006571152
  • propertyID: skl value: fx742458
isbn
  • 9521009381
isPartOf
name
  • Modeling of high-dose radiation damage in semiconductors
P60048
P60050
publication
  • location: Helsinki organizer: Helsingin yliopisto
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